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Title: Reliability based hardware Trojan design using physics-based electromigration models
Award ID(s):
1816361
NSF-PAR ID:
10104384
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Integration
Volume:
66
Issue:
C
ISSN:
0167-9260
Page Range / eLocation ID:
9 to 15
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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