Reliability based hardware Trojan design using physics-based electromigration models
- Award ID(s):
- 1816361
- NSF-PAR ID:
- 10104384
- Date Published:
- Journal Name:
- Integration
- Volume:
- 66
- Issue:
- C
- ISSN:
- 0167-9260
- Page Range / eLocation ID:
- 9 to 15
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation