Khanal, Subarna R, Gujrati, Abhijeet, Vishnubhotla, Sai Bharadwaj, Nowakowski, Pawel, Bonifacio, Cecile S, Pastewka, Lars, and Jacobs, Tevis D. Characterization of small-scale surface topography using transmission electron microscopy. Retrieved from https://par.nsf.gov/biblio/10107145. Surface Topography: Metrology and Properties 6.4 Web. doi:10.1088/2051-672X/aae5b3.

Khanal, Subarna R, Gujrati, Abhijeet, Vishnubhotla, Sai Bharadwaj, Nowakowski, Pawel, Bonifacio, Cecile S, Pastewka, Lars, & Jacobs, Tevis D. Characterization of small-scale surface topography using transmission electron microscopy. Surface Topography: Metrology and Properties, 6 (4). Retrieved from https://par.nsf.gov/biblio/10107145. https://doi.org/10.1088/2051-672X/aae5b3

Khanal, Subarna R, Gujrati, Abhijeet, Vishnubhotla, Sai Bharadwaj, Nowakowski, Pawel, Bonifacio, Cecile S, Pastewka, Lars, and Jacobs, Tevis D. "Characterization of small-scale surface topography using transmission electron microscopy". Surface Topography: Metrology and Properties 6 (4). Country unknown/Code not available. https://doi.org/10.1088/2051-672X/aae5b3. https://par.nsf.gov/biblio/10107145.

@article{osti_10107145,
place = {Country unknown/Code not available}, title = {Characterization of small-scale surface topography using transmission electron microscopy}, url = {https://par.nsf.gov/biblio/10107145}, DOI = {10.1088/2051-672X/aae5b3}, abstractNote = {}, journal = {Surface Topography: Metrology and Properties}, volume = {6}, number = {4}, author = {Khanal, Subarna R and Gujrati, Abhijeet and Vishnubhotla, Sai Bharadwaj and Nowakowski, Pawel and Bonifacio, Cecile S and Pastewka, Lars and Jacobs, Tevis D}, }