Su, Patrick, Hsiao, Fu-Chen, O'Brien, Thomas, and Dallesasse, John M. Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs. Retrieved from https://par.nsf.gov/biblio/10109824. IEEE Transactions on Semiconductor Manufacturing 31.4 Web. doi:10.1109/TSM.2018.2866065.

Su, Patrick, Hsiao, Fu-Chen, O'Brien, Thomas, & Dallesasse, John M. Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs. IEEE Transactions on Semiconductor Manufacturing, 31 (4). Retrieved from https://par.nsf.gov/biblio/10109824. https://doi.org/10.1109/TSM.2018.2866065

Su, Patrick, Hsiao, Fu-Chen, O'Brien, Thomas, and Dallesasse, John M. "Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs". IEEE Transactions on Semiconductor Manufacturing 31 (4). Country unknown/Code not available. https://doi.org/10.1109/TSM.2018.2866065. https://par.nsf.gov/biblio/10109824.

@article{osti_10109824,
place = {Country unknown/Code not available}, title = {Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs}, url = {https://par.nsf.gov/biblio/10109824}, DOI = {10.1109/TSM.2018.2866065}, abstractNote = {}, journal = {IEEE Transactions on Semiconductor Manufacturing}, volume = {31}, number = {4}, author = {Su, Patrick and Hsiao, Fu-Chen and O'Brien, Thomas and Dallesasse, John M.}, }