Shan, Bohan, McIntyre, Sean M., Armstrong, Mitchell R., Shen, Yuxia, and Mu, Bin. Investigation of Missing-Cluster Defects in UiO-66 and Ferrocene Deposition into Defect-Induced Cavities. Retrieved from https://par.nsf.gov/biblio/10111310. Industrial & Engineering Chemistry Research 57.42 Web. doi:10.1021/acs.iecr.8b03516.

Shan, Bohan, McIntyre, Sean M., Armstrong, Mitchell R., Shen, Yuxia, & Mu, Bin. Investigation of Missing-Cluster Defects in UiO-66 and Ferrocene Deposition into Defect-Induced Cavities. Industrial & Engineering Chemistry Research, 57 (42). Retrieved from https://par.nsf.gov/biblio/10111310. https://doi.org/10.1021/acs.iecr.8b03516

Shan, Bohan, McIntyre, Sean M., Armstrong, Mitchell R., Shen, Yuxia, and Mu, Bin. "Investigation of Missing-Cluster Defects in UiO-66 and Ferrocene Deposition into Defect-Induced Cavities". Industrial & Engineering Chemistry Research 57 (42). Country unknown/Code not available. https://doi.org/10.1021/acs.iecr.8b03516. https://par.nsf.gov/biblio/10111310.

@article{osti_10111310,
place = {Country unknown/Code not available}, title = {Investigation of Missing-Cluster Defects in UiO-66 and Ferrocene Deposition into Defect-Induced Cavities}, url = {https://par.nsf.gov/biblio/10111310}, DOI = {10.1021/acs.iecr.8b03516}, abstractNote = {}, journal = {Industrial & Engineering Chemistry Research}, volume = {57}, number = {42}, author = {Shan, Bohan and McIntyre, Sean M. and Armstrong, Mitchell R. and Shen, Yuxia and Mu, Bin}, }