Prasai, K., Jiang, J., Mishkin, A., Shyam, B., Angelova, S., Birney, R., Drabold, D. A., Fazio, M., Gustafson, E. K., Harry, G., Hoback, S., Hough, J., Lévesque, C., MacLaren, I., Markosyan, A., Martin, I. W., Menoni, C. S., Murray, P. G., Penn, S., Reid, S., Robie, R., Rowan, S., Schiettekatte, F., Shink, R., Turner, A., Vajente, G., Cheng, H-P., Fejer, M. M., Mehta, A., and Bassiri, R.. High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing. Physical Review Letters 123.4 Web. doi:10.1103/PhysRevLett.123.045501.

Prasai, K., Jiang, J., Mishkin, A., Shyam, B., Angelova, S., Birney, R., Drabold, D. A., Fazio, M., Gustafson, E. K., Harry, G., Hoback, S., Hough, J., Lévesque, C., MacLaren, I., Markosyan, A., Martin, I. W., Menoni, C. S., Murray, P. G., Penn, S., Reid, S., Robie, R., Rowan, S., Schiettekatte, F., Shink, R., Turner, A., Vajente, G., Cheng, H-P., Fejer, M. M., Mehta, A., & Bassiri, R.. High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing. Physical Review Letters, 123 (4). https://doi.org/10.1103/PhysRevLett.123.045501

Prasai, K., Jiang, J., Mishkin, A., Shyam, B., Angelova, S., Birney, R., Drabold, D. A., Fazio, M., Gustafson, E. K., Harry, G., Hoback, S., Hough, J., Lévesque, C., MacLaren, I., Markosyan, A., Martin, I. W., Menoni, C. S., Murray, P. G., Penn, S., Reid, S., Robie, R., Rowan, S., Schiettekatte, F., Shink, R., Turner, A., Vajente, G., Cheng, H-P., Fejer, M. M., Mehta, A., and Bassiri, R.. "High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing". Physical Review Letters 123 (4). Country unknown/Code not available: American Physical Society. https://doi.org/10.1103/PhysRevLett.123.045501. https://par.nsf.gov/biblio/10114432.

@article{osti_10114432,
place = {Country unknown/Code not available}, title = {High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing}, url = {https://par.nsf.gov/biblio/10114432}, DOI = {10.1103/PhysRevLett.123.045501}, abstractNote = {Not Available}, journal = {Physical Review Letters}, volume = {123}, number = {4}, publisher = {American Physical Society}, author = {Prasai, K. and Jiang, J. and Mishkin, A. and Shyam, B. and Angelova, S. and Birney, R. and Drabold, D. A. and Fazio, M. and Gustafson, E. K. and Harry, G. and Hoback, S. and Hough, J. and Lévesque, C. and MacLaren, I. and Markosyan, A. and Martin, I. W. and Menoni, C. S. and Murray, P. G. and Penn, S. and Reid, S. and Robie, R. and Rowan, S. and Schiettekatte, F. and Shink, R. and Turner, A. and Vajente, G. and Cheng, H-P. and Fejer, M. M. and Mehta, A. and Bassiri, R.}, }