Talukdar, Tahmid H., Allen, Gabriel D., Kravchenko, Ivan, and Ryckman, Judson D. Single-mode porous silicon waveguide interferometers with unity confinement factors for ultra-sensitive surface adlayer sensing. Optics Express 27.16 Web. doi:10.1364/OE.27.022485.

Talukdar, Tahmid H., Allen, Gabriel D., Kravchenko, Ivan, & Ryckman, Judson D. Single-mode porous silicon waveguide interferometers with unity confinement factors for ultra-sensitive surface adlayer sensing. Optics Express, 27 (16). https://doi.org/10.1364/OE.27.022485

Talukdar, Tahmid H., Allen, Gabriel D., Kravchenko, Ivan, and Ryckman, Judson D. "Single-mode porous silicon waveguide interferometers with unity confinement factors for ultra-sensitive surface adlayer sensing". Optics Express 27 (16). Country unknown/Code not available: Optical Society of America. https://doi.org/10.1364/OE.27.022485. https://par.nsf.gov/biblio/10114484.

@article{osti_10114484,
place = {Country unknown/Code not available}, title = {Single-mode porous silicon waveguide interferometers with unity confinement factors for ultra-sensitive surface adlayer sensing}, url = {https://par.nsf.gov/biblio/10114484}, DOI = {10.1364/OE.27.022485}, abstractNote = {Not Available}, journal = {Optics Express}, volume = {27}, number = {16}, publisher = {Optical Society of America}, author = {Talukdar, Tahmid H. and Allen, Gabriel D. and Kravchenko, Ivan and Ryckman, Judson D.}, }