Agarwal, Akshay, Berggren, Karl K., van Staaden, Yuri J., and Goyal, Vivek K. Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination. Physical Review A 99.6 Web. doi:10.1103/PhysRevA.99.063809.

Agarwal, Akshay, Berggren, Karl K., van Staaden, Yuri J., & Goyal, Vivek K. Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination. Physical Review A, 99 (6). https://doi.org/10.1103/PhysRevA.99.063809

Agarwal, Akshay, Berggren, Karl K., van Staaden, Yuri J., and Goyal, Vivek K. "Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination". Physical Review A 99 (6). Country unknown/Code not available: American Physical Society. https://doi.org/10.1103/PhysRevA.99.063809. https://par.nsf.gov/biblio/10115794.

@article{osti_10115794,
place = {Country unknown/Code not available}, title = {Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination}, url = {https://par.nsf.gov/biblio/10115794}, DOI = {10.1103/PhysRevA.99.063809}, abstractNote = {Not Available}, journal = {Physical Review A}, volume = {99}, number = {6}, publisher = {American Physical Society}, author = {Agarwal, Akshay and Berggren, Karl K. and van Staaden, Yuri J. and Goyal, Vivek K.}, }