Data Verification in Integrated RFID Systems

Sakai, Kazuya; Sun, Min-Te; Ku, Wei-Shinn; Lu, Hua; Lai, Ten H.

doi:10.1109/JSYST.2018.2865571

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Citation Details

Data Verification in Integrated RFID Systems

Award ID(s):: 1642133

NSF-PAR ID:: 10119665

Author(s) / Creator(s):: Sakai, Kazuya; Sun, Min-Te; Ku, Wei-Shinn; Lu, Hua; Lai, Ten H.

Date Published:: 2019-06-01

Journal Name:: IEEE Systems Journal

Volume:: 13

Issue:: 2

ISSN:: 1932-8184

Page Range / eLocation ID:: 1969 to 1980

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1109/JSYST.2018.2865571

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