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Title: Intrinsic current overshoot during thermal-runaway threshold switching events in TaO x devices
Authors:
 ;  
Publication Date:
NSF-PAR ID:
10119738
Journal Name:
Journal of Applied Physics
Volume:
126
Issue:
3
Page Range or eLocation-ID:
Article No. 035108
ISSN:
0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
National Science Foundation
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