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Title: Intrinsic current overshoot during thermal-runaway threshold switching events in TaO x devices
NSF-PAR ID:
10119738
Author(s) / Creator(s):
 ;  
Publisher / Repository:
American Institute of Physics
Date Published:
Journal Name:
Journal of Applied Physics
Volume:
126
Issue:
3
ISSN:
0021-8979
Page Range / eLocation ID:
Article No. 035108
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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