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Title: A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors
Award ID(s):
1751064
PAR ID:
10121194
Author(s) / Creator(s):
Date Published:
Journal Name:
IFIP/IEEE ... International Conference on Very Large Scale Integration
ISSN:
2577-5065
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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