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  • Directly Probing the Phase States and Surface Tension of Individual Submicrometer Particles Using Atomic Force Microscopy
Title: Directly Probing the Phase States and Surface Tension of Individual Submicrometer Particles Using Atomic Force Microscopy
Award ID(s):
1305427
PAR ID:
10123867
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
ACS symposium series
Volume:
1299
ISSN:
0097-6156
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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