Akkopru-Akgun, Betul, Zhu, Wanlin, Randall, Clive A., Lanagan, Michael T., and Trolier-McKinstry, Susan. Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films. Retrieved from https://par.nsf.gov/biblio/10130935. APL Materials 7.12 Web. doi:10.1063/1.5115391.
Akkopru-Akgun, Betul, Zhu, Wanlin, Randall, Clive A., Lanagan, Michael T., & Trolier-McKinstry, Susan. Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films. APL Materials, 7 (12). Retrieved from https://par.nsf.gov/biblio/10130935. https://doi.org/10.1063/1.5115391
Akkopru-Akgun, Betul, Zhu, Wanlin, Randall, Clive A., Lanagan, Michael T., and Trolier-McKinstry, Susan.
"Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films". APL Materials 7 (12). Country unknown/Code not available. https://doi.org/10.1063/1.5115391.https://par.nsf.gov/biblio/10130935.
@article{osti_10130935,
place = {Country unknown/Code not available},
title = {Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films},
url = {https://par.nsf.gov/biblio/10130935},
DOI = {10.1063/1.5115391},
abstractNote = {},
journal = {APL Materials},
volume = {7},
number = {12},
author = {Akkopru-Akgun, Betul and Zhu, Wanlin and Randall, Clive A. and Lanagan, Michael T. and Trolier-McKinstry, Susan},
}
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