Galy, Tiphaine, Marszewski, Michal, King, Sophia, Yan, Yan, Tolbert, Sarah H., and Pilon, Laurent. Comparing methods for measuring thickness, refractive index, and porosity of mesoporous thin films. Retrieved from https://par.nsf.gov/biblio/10131985. Microporous and Mesoporous Materials 291.C Web. doi:10.1016/j.micromeso.2019.109677.

Galy, Tiphaine, Marszewski, Michal, King, Sophia, Yan, Yan, Tolbert, Sarah H., & Pilon, Laurent. Comparing methods for measuring thickness, refractive index, and porosity of mesoporous thin films. Microporous and Mesoporous Materials, 291 (C). Retrieved from https://par.nsf.gov/biblio/10131985. https://doi.org/10.1016/j.micromeso.2019.109677

Galy, Tiphaine, Marszewski, Michal, King, Sophia, Yan, Yan, Tolbert, Sarah H., and Pilon, Laurent. "Comparing methods for measuring thickness, refractive index, and porosity of mesoporous thin films". Microporous and Mesoporous Materials 291 (C). Country unknown/Code not available. https://doi.org/10.1016/j.micromeso.2019.109677. https://par.nsf.gov/biblio/10131985.

@article{osti_10131985,
place = {Country unknown/Code not available}, title = {Comparing methods for measuring thickness, refractive index, and porosity of mesoporous thin films}, url = {https://par.nsf.gov/biblio/10131985}, DOI = {10.1016/j.micromeso.2019.109677}, abstractNote = {}, journal = {Microporous and Mesoporous Materials}, volume = {291}, number = {C}, author = {Galy, Tiphaine and Marszewski, Michal and King, Sophia and Yan, Yan and Tolbert, Sarah H. and Pilon, Laurent}, }