skip to main content


Title: Towards Improved Testing For Deep Learning
Award ID(s):
1650512
NSF-PAR ID:
10144008
Author(s) / Creator(s):
;
Date Published:
Journal Name:
2019 IEEE/ACM 41st International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER)
Page Range / eLocation ID:
85-88
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
No document suggestions found