Kenarangi, Farid, Hu, Xuan, Liu, Yihan, Incorvia, Jean Anne, Friedman, Joseph S., and Partin-Vaisband, Inna. Exploiting Dual-Gate Ambipolar CNFETs for Scalable Machine Learning Classification. Retrieved from https://par.nsf.gov/biblio/10146598. Scientific Reports 10.1 Web. doi:10.1038/s41598-020-62718-0.

Kenarangi, Farid, Hu, Xuan, Liu, Yihan, Incorvia, Jean Anne, Friedman, Joseph S., & Partin-Vaisband, Inna. Exploiting Dual-Gate Ambipolar CNFETs for Scalable Machine Learning Classification. Scientific Reports, 10 (1). Retrieved from https://par.nsf.gov/biblio/10146598. https://doi.org/10.1038/s41598-020-62718-0

Kenarangi, Farid, Hu, Xuan, Liu, Yihan, Incorvia, Jean Anne, Friedman, Joseph S., and Partin-Vaisband, Inna. "Exploiting Dual-Gate Ambipolar CNFETs for Scalable Machine Learning Classification". Scientific Reports 10 (1). Country unknown/Code not available. https://doi.org/10.1038/s41598-020-62718-0. https://par.nsf.gov/biblio/10146598.

@article{osti_10146598,
place = {Country unknown/Code not available}, title = {Exploiting Dual-Gate Ambipolar CNFETs for Scalable Machine Learning Classification}, url = {https://par.nsf.gov/biblio/10146598}, DOI = {10.1038/s41598-020-62718-0}, abstractNote = {}, journal = {Scientific Reports}, volume = {10}, number = {1}, author = {Kenarangi, Farid and Hu, Xuan and Liu, Yihan and Incorvia, Jean Anne and Friedman, Joseph S. and Partin-Vaisband, Inna}, }