Lenney, Samuel L., Grossklaus, Kevin, Stevens, Margaret, Vandervelde, Thomas, Sadwick, Laurence P., and Yang, Tianxin. Optical property comparison of GaAsBi and TlGaAs measured by variable angle spectroscopic ellipsometry. Retrieved from https://par.nsf.gov/biblio/10152808. Optical property comparison of GaAsBi and TlGaAs Measured by variable angle spectroscopic ellipsometry . Web. doi:10.1117/12.2510550.

Lenney, Samuel L., Grossklaus, Kevin, Stevens, Margaret, Vandervelde, Thomas, Sadwick, Laurence P., & Yang, Tianxin. Optical property comparison of GaAsBi and TlGaAs measured by variable angle spectroscopic ellipsometry. Optical property comparison of GaAsBi and TlGaAs Measured by variable angle spectroscopic ellipsometry, (). Retrieved from https://par.nsf.gov/biblio/10152808. https://doi.org/10.1117/12.2510550

Lenney, Samuel L., Grossklaus, Kevin, Stevens, Margaret, Vandervelde, Thomas, Sadwick, Laurence P., and Yang, Tianxin. "Optical property comparison of GaAsBi and TlGaAs measured by variable angle spectroscopic ellipsometry". Optical property comparison of GaAsBi and TlGaAs Measured by variable angle spectroscopic ellipsometry (). Country unknown/Code not available. https://doi.org/10.1117/12.2510550. https://par.nsf.gov/biblio/10152808.

@article{osti_10152808,
place = {Country unknown/Code not available}, title = {Optical property comparison of GaAsBi and TlGaAs measured by variable angle spectroscopic ellipsometry}, url = {https://par.nsf.gov/biblio/10152808}, DOI = {10.1117/12.2510550}, abstractNote = {􀀞􀀞􀀞􀀇􀀫􀀁􀁄􀀶􀀾􀀺􀀴􀁀􀀿􀀵􀁆􀀴􀁅􀁀􀁃􀁄􀀁􀀹􀀲􀁇􀀶􀀁􀀳􀁃􀁀􀀲􀀵􀀁􀁆􀁄􀀶􀁄􀀁􀀺􀀿􀀁􀁀􀁁􀁅􀁀􀀶􀀽􀀶􀀴􀁅􀁃􀁀􀀿􀀺􀀴􀁄􀀁􀀵􀁆􀀶􀀁􀁅􀁀􀀁􀁅􀀹􀀶􀀺􀁃􀀁􀀵􀀺􀁃􀀶􀀴􀁅􀀁􀀳􀀲􀀿􀀵􀀁􀀸􀀲􀁁􀁄􀀁􀀲􀀿􀀵􀀁􀀹􀀺􀀸􀀹􀀁􀀴􀀲􀁃􀁃􀀺􀀶􀁃􀀁􀀾􀁀􀁅􀀺􀀽􀀺􀁅􀀺􀀶􀁄􀀈􀀁􀀜􀀲􀀖􀁄􀀃􀀋􀀇 􀁉􀀄􀀗􀀺􀁉􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀁉􀀜􀀲􀀃􀀋􀀇􀁉􀀄􀀖􀁄􀀁􀁅􀀶􀁃􀀿􀀲􀁃􀁊􀀁􀀲􀀽􀀽􀁀􀁊􀁄􀀁􀀲􀁃􀀶􀀁􀁀􀀷􀀁􀀺􀀿􀁅􀀶􀁃􀀶􀁄􀁅􀀁􀀷􀁀􀁃􀀁􀀽􀀺􀀸􀀹􀁅􀀁􀀶􀀾􀀺􀁅􀁅􀀺􀀿􀀸􀀆􀀁􀀽􀀺􀀸􀀹􀁅􀀁􀀲􀀳􀁄􀁀􀁃􀀳􀀺􀀿􀀸􀀁􀀲􀀿􀀵􀀁􀁀􀁅􀀹􀀶􀁃􀀁􀀲􀁁􀁁􀀽􀀺􀀴􀀲􀁅􀀺􀁀􀀿􀁄􀀁􀀃􀀶􀀈􀀸􀀈 􀀴􀁀􀀾􀀾􀁆􀀿􀀺􀀴􀀲􀁅􀀺􀁀􀀿􀀁􀀽􀀲􀁄􀀶􀁃􀁄􀀆􀀁􀁁􀀹􀁀􀁅􀁀􀁇􀁀􀀽􀁅􀀲􀀺􀀴􀁄􀀆􀀁􀀲􀀿􀀵􀀁􀀹􀀺􀀸􀀹􀀁􀁄􀁁􀀶􀀶􀀵􀀁􀁅􀁃􀀲􀀿􀁄􀀺􀁄􀁅􀁀􀁃􀁄􀀄􀀁􀀺􀀿􀀁􀁅􀀹􀀶􀀁􀀺􀀿􀀷􀁃􀀲􀁃􀀶􀀵􀀁􀁄􀁁􀀶􀀴􀁅􀁃􀁆􀀾􀀁􀀵􀁆􀀶􀀁􀁅􀁀􀀁􀁅􀀹􀀶􀀺􀁃􀀁􀀵􀀶􀀴􀁃􀀶􀀲􀁄􀀶􀀵􀀁􀀳􀀲􀀿􀀵􀀸􀀲􀁁 􀁃􀀶􀀽􀀲􀁅􀀺􀁇􀀶􀀁􀁅􀁀􀀁􀀜􀀲􀀖􀁄􀀈􀀁􀀬􀀹􀀺􀀽􀀶􀀁􀀜􀀲􀀖􀁄􀀁􀀹􀀲􀁄􀀁􀀳􀀶􀀶􀀿􀀁􀀶􀁉􀁅􀀶􀀿􀁄􀀺􀁇􀀶􀀽􀁊􀀁􀁄􀁅􀁆􀀵􀀺􀀶􀀵􀀆􀀁􀁅􀀹􀀶􀀁􀁀􀁁􀁅􀀺􀀴􀀲􀀽􀀁􀁁􀁃􀁀􀁁􀀶􀁃􀁅􀀺􀀶􀁄􀀁􀁀􀀷􀀁􀀜􀀲􀀖􀁄􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀜􀀲􀀖􀁄􀀁􀀲􀁃􀀶􀀁􀀽􀀶􀁄􀁄 􀀵􀁀􀀴􀁆􀀾􀀶􀀿􀁅􀀶􀀵􀀁􀀲􀀿􀀵􀀁􀁄􀀹􀁀􀁈􀀁􀁄􀀺􀀸􀀿􀀺􀀷􀀺􀀴􀀲􀀿􀁅􀀁􀁇􀀲􀁃􀀺􀀲􀁅􀀺􀁀􀀿􀀁􀁈􀀺􀁅􀀹􀀁􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀁􀀴􀁀􀀿􀁅􀀶􀀿􀁅􀀁􀁃􀀶􀁄􀁁􀀶􀀴􀁅􀀺􀁇􀀶􀀽􀁊􀀈 􀀩􀀹􀀺􀁄􀀁􀁄􀁅􀁆􀀵􀁊􀀁􀀴􀀹􀀲􀁃􀀲􀀴􀁅􀀶􀁃􀀺􀁋􀀶􀀵􀀁􀁅􀀹􀀶􀀁􀁀􀁁􀁅􀀺􀀴􀀲􀀽􀀁􀁁􀁃􀁀􀁁􀀶􀁃􀁅􀀺􀀶􀁄􀀁􀁀􀀷􀀁􀀜􀀲􀀖􀁄􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀜􀀲􀀖􀁄􀀁􀀷􀀺􀀽􀀾􀁄􀀁􀁀􀀷􀀁􀁇􀀲􀁃􀁊􀀺􀀿􀀸􀀁􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀁􀀴􀁀􀀾􀁁􀁀􀁄􀀺􀁅􀀺􀁀􀀿􀀁􀁆􀁄􀀺􀀿􀀸􀀁 􀁇􀀲􀁃􀀺􀀲􀀳􀀽􀀶􀀁􀀲􀀿􀀸􀀽􀀶􀀁􀁄􀁁􀀶􀀴􀁅􀁃􀁀􀁄􀀴􀁀􀁁􀀺􀀴􀀁􀀶􀀽􀀽􀀺􀁁􀁄􀁀􀀾􀀶􀁅􀁃􀁊􀀁􀀃􀀫􀀖􀀨􀀚􀀄􀀁􀀺􀀿􀀁􀀲􀀁􀁃􀀲􀀿􀀸􀀶􀀁􀁀􀀷􀀁􀁅􀀶􀀾􀁁􀀶􀁃􀀲􀁅􀁆􀁃􀀶􀁄􀀁􀀷􀁃􀁀􀀾􀀁􀀌􀀏􀀁􀁖􀀘􀀁􀁑􀀁􀀍􀀊􀀊􀀁􀁖􀀘􀀈􀀁􀀜􀀲􀀖􀁄􀀗􀀺􀀁􀀷􀀺􀀽􀀾􀁄􀀁􀁈􀀶􀁃􀀶􀀁 􀀸􀁃􀁀􀁈􀀿􀀁􀀳􀀶􀁅􀁈􀀶􀀶􀀿􀀁􀀍􀀈􀀍􀀂􀀁􀀲􀀿􀀵􀀁􀀐􀀈􀀏􀀂􀀁􀀳􀀺􀁄􀀾􀁆􀁅􀀹􀀈􀀁􀀩􀀽􀀜􀀲􀀖􀁄􀀁􀀷􀀺􀀽􀀾􀁄􀀁􀁈􀀶􀁃􀀶􀀁􀀸􀁃􀁀􀁈􀀿􀀁􀀳􀀶􀁅􀁈􀀶􀀶􀀿􀀁􀀋􀀈􀀑􀀂􀀁􀀲􀀿􀀵􀀁􀀌􀀈􀀑􀀂􀀁􀁅􀀹􀀲􀀽􀀽􀀺􀁆􀀾􀀈􀀁􀀢􀁀􀀵􀀶􀀽􀀺􀀿􀀸􀀁􀁆􀁄􀀺􀀿􀀸􀀁􀀲􀀁 􀁄􀁆􀁁􀀶􀁃􀁁􀁀􀁄􀀺􀁅􀀺􀁀􀀿􀀁􀁀􀀷􀀁􀀜􀀲􀁆􀁄􀁄􀀺􀀲􀀿􀀁􀁀􀁄􀀴􀀺􀀽􀀽􀀲􀁅􀁀􀁃􀁄􀀁􀀷􀀺􀁅􀀁􀁅􀁀􀀁􀁅􀀹􀀶􀀁􀀵􀀺􀀶􀀽􀀶􀀴􀁅􀁃􀀺􀀴􀀁􀀷􀁆􀀿􀀴􀁅􀀺􀁀􀀿􀁄􀀁􀁀􀀷􀀁􀁄􀀲􀀾􀁁􀀽􀀶􀀁􀀽􀀲􀁊􀀶􀁃􀁄􀀁􀁈􀀲􀁄􀀁􀁆􀁄􀀶􀀵􀀁􀁅􀁀􀀁􀁄􀀶􀁁􀀲􀁃􀀲􀁅􀀶􀀁􀀷􀀺􀀽􀀾􀀁􀁀􀁁􀁅􀀺􀀴􀀲􀀽􀀁 􀁁􀁃􀁀􀁁􀀶􀁃􀁅􀀺􀀶􀁄􀀁􀀷􀁃􀁀􀀾􀀁􀁅􀀹􀀶􀀁􀁁􀁄􀀶􀁆􀀵􀁀􀁀􀁁􀁅􀀺􀀴􀀲􀀽􀀁􀁁􀁃􀁀􀁁􀀶􀁃􀁅􀀺􀀶􀁄􀀁􀁀􀀷􀀁􀁅􀀹􀀶􀀁􀁄􀀲􀀾􀁁􀀽􀀶􀀈􀀁 􀀩􀀹􀀶􀀁􀀲􀀿􀀲􀀽􀁊􀁄􀀺􀁄􀀁􀀺􀀿􀀁􀁅􀀹􀀺􀁄􀀁􀁄􀁅􀁆􀀵􀁊􀀁􀀵􀀺􀁃􀀶􀀴􀁅􀀽􀁊􀀁􀀴􀁀􀀾􀁁􀀲􀁃􀀶􀁄􀀁􀁅􀀹􀀶􀀁􀀺􀀿􀀴􀀽􀁆􀁄􀀺􀁀􀀿􀀁􀁀􀀷􀀁􀁅􀀹􀀶􀀁􀁅􀁈􀁀􀀁􀀽􀀲􀁃􀀸􀀶􀁄􀁅􀀁􀀞􀀞􀀞􀀇􀀫􀀁􀀴􀁀􀀿􀁄􀁅􀀺􀁅􀁆􀀶􀀿􀁅􀀁􀀲􀁅􀁀􀀾􀁄􀀆􀀁􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀈􀀁 􀀘􀁀􀀾􀁁􀀲􀁃􀀺􀁄􀁀􀀿􀀁􀁀􀀷􀀁􀁅􀀹􀀶􀀁􀁃􀀶􀀷􀁃􀀲􀀴􀁅􀀺􀁇􀀶􀀁􀀺􀀿􀀵􀀶􀁉􀀁􀀲􀀿􀀵􀀁􀀲􀀳􀁄􀁀􀁃􀁁􀁅􀀺􀁀􀀿􀀁􀀴􀁀􀀶􀀷􀀷􀀺􀀴􀀺􀀶􀀿􀁅􀀁􀁀􀀷􀀁􀁄􀀲􀀾􀁁􀀽􀀶􀁄􀀁􀁈􀀲􀁄􀀁􀀵􀁀􀀿􀀶􀀁􀁀􀁇􀀶􀁃􀀁􀀲􀀁􀁄􀁁􀀶􀀴􀁅􀁃􀀲􀀽􀀁􀁃􀀲􀀿􀀸􀀶􀀁􀁀􀀷􀀁􀀊􀀈􀀏􀀁􀀶􀀫􀀁􀁅􀁀􀀁􀀏􀀁 􀀶􀀫􀀁􀀃􀀌􀀏􀀊􀀁􀀿􀀾􀀁􀁅􀁀􀀁􀀌􀀏􀀊􀀊􀀁􀀿􀀾􀀄􀀈􀀁􀀩􀀹􀀺􀁄􀀁􀁃􀀶􀀸􀀺􀁀􀀿􀀁􀀵􀀺􀁄􀁁􀀽􀀲􀁊􀁄􀀁􀁅􀀹􀀶􀀁􀀲􀀳􀁄􀁀􀁃􀁁􀁅􀀺􀁀􀀿􀀁􀀶􀀵􀀸􀀶􀀁􀀴􀁀􀁃􀁃􀀶􀁄􀁁􀁀􀀿􀀵􀀺􀀿􀀸􀀁􀁅􀁀􀀁􀁅􀀹􀀶􀀁􀀳􀀲􀀿􀀵􀀸􀀲􀁁􀀁􀁀􀀷􀀁􀁅􀀹􀀶􀀁􀀾􀀲􀁅􀀶􀁃􀀺􀀲􀀽􀀆􀀁􀁈􀀹􀀺􀀴􀀹􀀁 􀀺􀁄􀀁􀁅􀀹􀀶􀀿􀀁􀀴􀁀􀁃􀁃􀀶􀀽􀀲􀁅􀀶􀀵􀀁􀁅􀁀􀀁􀁅􀀹􀀶􀀁􀀺􀀿􀀴􀁀􀁃􀁁􀁀􀁃􀀲􀁅􀀺􀁀􀀿􀀁􀁀􀀷􀀁􀀗􀀺􀀁􀀲􀀿􀀵􀀁􀀩􀀽􀀁􀀺􀀿􀀁􀁅􀀹􀀶􀀁􀁄􀀲􀀾􀁁􀀽􀀶􀁄􀀈􀀁􀀩􀀹􀀺􀁄􀀁􀀴􀀹􀀲􀁃􀀲􀀴􀁅􀀶􀁃􀀺􀁋􀀲􀁅􀀺􀁀􀀿􀀁􀀲􀀽􀀽􀁀􀁈􀁄􀀁􀀷􀁀􀁃􀀁􀀳􀀶􀁅􀁅􀀶􀁃􀀁􀀾􀁀􀀵􀀶􀀽􀀺􀀿􀀸􀀁􀁀􀀷􀀁 􀁅􀀹􀀶􀁄􀀶􀀁􀀲􀀽􀀽􀁀􀁊􀁄􀀁􀀷􀁀􀁃􀀁􀀳􀁀􀁅􀀹􀀁􀀲􀀁􀀷􀁆􀀿􀀵􀀲􀀾􀀶􀀿􀁅􀀲􀀽􀀁􀁆􀀿􀀵􀀶􀁃􀁄􀁅􀀲􀀿􀀵􀀺􀀿􀀸􀀁􀁀􀀷􀀁􀁅􀀹􀀶􀀺􀁃􀀁􀁁􀁃􀁀􀁁􀀶􀁃􀁅􀀺􀀶􀁄􀀁􀀲􀀿􀀵􀀁􀀷􀁀􀁃􀀁􀁅􀀹􀀶􀀺􀁃􀀁􀀺􀀿􀀴􀀽􀁆􀁄􀀺􀁀􀀿􀀁􀀺􀀿􀀁􀀷􀁆􀁅􀁆􀁃􀀶􀀁􀀵􀀶􀁇􀀺􀀴􀀶􀁄􀀈􀀁}, journal = {Optical property comparison of GaAsBi and TlGaAs Measured by variable angle spectroscopic ellipsometry}, author = {Lenney, Samuel L. and Grossklaus, Kevin and Stevens, Margaret and Vandervelde, Thomas and Sadwick, Laurence P. and Yang, Tianxin}, }