Peart, Matthew R., Wei, Xiongliang, Borovac, Damir, Sun, Wei, Tansu, Nelson, and Wierer, Jonathan J. Thermal Oxidation of AlInN for III-Nitride Electronic and Optoelectronic Devices. Retrieved from https://par.nsf.gov/biblio/10155180. ACS Applied Electronic Materials 1.8 Web. doi:10.1021/acsaelm.9b00266.

Peart, Matthew R., Wei, Xiongliang, Borovac, Damir, Sun, Wei, Tansu, Nelson, & Wierer, Jonathan J. Thermal Oxidation of AlInN for III-Nitride Electronic and Optoelectronic Devices. ACS Applied Electronic Materials, 1 (8). Retrieved from https://par.nsf.gov/biblio/10155180. https://doi.org/10.1021/acsaelm.9b00266

Peart, Matthew R., Wei, Xiongliang, Borovac, Damir, Sun, Wei, Tansu, Nelson, and Wierer, Jonathan J. "Thermal Oxidation of AlInN for III-Nitride Electronic and Optoelectronic Devices". ACS Applied Electronic Materials 1 (8). Country unknown/Code not available. https://doi.org/10.1021/acsaelm.9b00266. https://par.nsf.gov/biblio/10155180.

@article{osti_10155180,
place = {Country unknown/Code not available}, title = {Thermal Oxidation of AlInN for III-Nitride Electronic and Optoelectronic Devices}, url = {https://par.nsf.gov/biblio/10155180}, DOI = {10.1021/acsaelm.9b00266}, abstractNote = {}, journal = {ACS Applied Electronic Materials}, volume = {1}, number = {8}, author = {Peart, Matthew R. and Wei, Xiongliang and Borovac, Damir and Sun, Wei and Tansu, Nelson and Wierer, Jonathan J.}, }