Dorfi, Anna E., Zhou, Shijie, West, Alan C., Wright, John, and Esposito, Daniel V. Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging. ChemElectroChem 7.11 Web. doi:10.1002/celc.202000476.

Dorfi, Anna E., Zhou, Shijie, West, Alan C., Wright, John, & Esposito, Daniel V. Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging. ChemElectroChem, 7 (11). https://doi.org/10.1002/celc.202000476

Dorfi, Anna E., Zhou, Shijie, West, Alan C., Wright, John, and Esposito, Daniel V. "Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging". ChemElectroChem 7 (11). Country unknown/Code not available: Wiley Blackwell (John Wiley & Sons). https://doi.org/10.1002/celc.202000476. https://par.nsf.gov/biblio/10158310.

@article{osti_10158310,
place = {Country unknown/Code not available}, title = {Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging}, url = {https://par.nsf.gov/biblio/10158310}, DOI = {10.1002/celc.202000476}, abstractNote = {Not Available}, journal = {ChemElectroChem}, volume = {7}, number = {11}, publisher = {Wiley Blackwell (John Wiley & Sons)}, author = {Dorfi, Anna E. and Zhou, Shijie and West, Alan C. and Wright, John and Esposito, Daniel V.}, }