Structural and Compositional Properties of Recrystallized CdS/CdTe Thin-Films Grown on Oxidized Silicon Substrates | NSF Public Access Repository

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Citation Details

Structural and Compositional Properties of Recrystallized CdS/CdTe Thin-Films Grown on Oxidized Silicon Substrates

Award ID(s):: 1711885

PAR ID:: 10169720

Author(s) / Creator(s):: Magginetti, David; Aguiar, Jeffery; Yoon, Heayoung

Date Published:: 2019-08-01

Journal Name:: Microscopy and Microanalysis

Volume:: 25

Issue:: S2

ISSN:: 1431-9276

Page Range / eLocation ID:: 2166 to 2167

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript
Journal Article:
https://doi.org/10.1017/S1431927619011565