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  • Thickness-Independent Semiconducting-to-Metallic Conversion in Wafer-Scale Two-Dimensional PtSe 2 Layers by Plasma-Driven Chalcogen Defect Engineering
Title: Thickness-Independent Semiconducting-to-Metallic Conversion in Wafer-Scale Two-Dimensional PtSe 2 Layers by Plasma-Driven Chalcogen Defect Engineering
Award ID(s):
1728309
PAR ID:
10176624
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ; ; ; ;
Date Published:
Journal Name:
ACS Applied Materials & Interfaces
Volume:
12
Issue:
12
ISSN:
1944-8244
Page Range / eLocation ID:
14341 to 14351
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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