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Title: Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference
Authors:
;
Publication Date:
NSF-PAR ID:
10178949
Journal Name:
Optics Express
Volume:
28
Issue:
16
Page Range or eLocation-ID:
Article No. 24198
ISSN:
1094-4087; OPEXFF
Publisher:
Optical Society of America
Sponsoring Org:
National Science Foundation
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