Jewell, M., Schubert, A., Cen, W.R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L.J., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G.F., Cao, L., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E.V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X.S., Johnston, S., Karelin, A., Kaufman, L.J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Leonard, D.S., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J.L., Ostrovskiy, I., Overman, C.T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. Retrieved from https://par.nsf.gov/biblio/10181915. Journal of Instrumentation 13.01 Web. doi:10.1088/1748-0221/13/01/P01006.

Jewell, M., Schubert, A., Cen, W.R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L.J., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G.F., Cao, L., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E.V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X.S., Johnston, S., Karelin, A., Kaufman, L.J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Leonard, D.S., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J.L., Ostrovskiy, I., Overman, C.T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., & Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. Journal of Instrumentation, 13 (01). Retrieved from https://par.nsf.gov/biblio/10181915. https://doi.org/10.1088/1748-0221/13/01/P01006

Jewell, M., Schubert, A., Cen, W.R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L.J., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G.F., Cao, L., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E.V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X.S., Johnston, S., Karelin, A., Kaufman, L.J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Leonard, D.S., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J.L., Ostrovskiy, I., Overman, C.T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. "Characterization of an Ionization Readout Tile for nEXO". Journal of Instrumentation 13 (01). Country unknown/Code not available. https://doi.org/10.1088/1748-0221/13/01/P01006. https://par.nsf.gov/biblio/10181915.

@article{osti_10181915,
place = {Country unknown/Code not available}, title = {Characterization of an Ionization Readout Tile for nEXO}, url = {https://par.nsf.gov/biblio/10181915}, DOI = {10.1088/1748-0221/13/01/P01006}, abstractNote = {}, journal = {Journal of Instrumentation}, volume = {13}, number = {01}, author = {Jewell, M. and Schubert, A. and Cen, W.R. and Dalmasson, J. and DeVoe, R. and Fabris, L. and Gratta, G. and Jamil, A. and Li, G. and Odian, A. and Patel, M. and Pocar, A. and Qiu, D. and Wang, Q. and Wen, L.J. and Albert, J.B. and Anton, G. and Arnquist, I.J. and Badhrees, I. and Barbeau, P. and Beck, D. and Belov, V. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, G.F. and Cao, L. and Chambers, C. and Charlebois, S.A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Cree, W. and Côté, M. and Daniels, T. and Daugherty, S.J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and Didberidze, T. and Dilling, J. and Ding, Y.Y. and Dolinski, M.J. and Dragone, A. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fontaine, R. and Fudenberg, D. and Giacomini, G. and Gornea, R. and Hansen, E.V. and Harris, D. and Hasan, M. and Heffner, M. and Hoppe, E. W. and House, A. and Hufschmidt, P. and Hughes, M. and Hößl, J. and Ito, Y. and Iverson, A. and Jiang, X.S. and Johnston, S. and Karelin, A. and Kaufman, L.J. and Koffas, T. and Kravitz, S. and Krücken, R. and Kuchenkov, A. and Kumar, K.S. and Lan, Y. and Leonard, D.S. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y.H. and MacLellan, R. and Michel, T. and Mong, B. and Moore, D. and Murray, K. and Newby, R.J. and Ning, Z. and Njoya, O. and Nolet, F. and Odgers, K. and Oriunno, M. and Orrell, J.L. and Ostrovskiy, I. and Overman, C.T. and Ortega, G. S. and Parent, S. and Piepke, A. and Pratte, J.-F. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Retiere, F. and Robinson, A. and Rossignol, T. and Rowson, P.C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schneider, J. and Sinclair, D. and Skarpaas, K. and Soma, A.K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X.L. and Tarka, M. and Todd, J. and Tolba, T. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J.-L. and Wagenpfeil, M. and Weber, M. and Wei, W. and Wichoski, U. and Wrede, G. and Wu, S.X. and Wu, W.H. and Yang, L. and Yen, Y.-R. and Zeldovich, O. and Zhang, X. and Zhao, J. and Zhou, Y. and Ziegler, T.}, }