Xu, Yun, Dzara, Michael J., Kabir, Sadia, Pylypenko, Svitlana, Neyerlin, Kenneth, and Zakutayev, Andriy. X-ray photoelectron spectroscopy and rotating disk electrode measurements of smooth sputtered Fe-N-C films. Retrieved from https://par.nsf.gov/biblio/10187914. Applied Surface Science 515.C Web. doi:10.1016/j.apsusc.2020.146012.

Xu, Yun, Dzara, Michael J., Kabir, Sadia, Pylypenko, Svitlana, Neyerlin, Kenneth, & Zakutayev, Andriy. X-ray photoelectron spectroscopy and rotating disk electrode measurements of smooth sputtered Fe-N-C films. Applied Surface Science, 515 (C). Retrieved from https://par.nsf.gov/biblio/10187914. https://doi.org/10.1016/j.apsusc.2020.146012

Xu, Yun, Dzara, Michael J., Kabir, Sadia, Pylypenko, Svitlana, Neyerlin, Kenneth, and Zakutayev, Andriy. "X-ray photoelectron spectroscopy and rotating disk electrode measurements of smooth sputtered Fe-N-C films". Applied Surface Science 515 (C). Country unknown/Code not available. https://doi.org/10.1016/j.apsusc.2020.146012. https://par.nsf.gov/biblio/10187914.

@article{osti_10187914,
place = {Country unknown/Code not available}, title = {X-ray photoelectron spectroscopy and rotating disk electrode measurements of smooth sputtered Fe-N-C films}, url = {https://par.nsf.gov/biblio/10187914}, DOI = {10.1016/j.apsusc.2020.146012}, abstractNote = {}, journal = {Applied Surface Science}, volume = {515}, number = {C}, author = {Xu, Yun and Dzara, Michael J. and Kabir, Sadia and Pylypenko, Svitlana and Neyerlin, Kenneth and Zakutayev, Andriy}, }