Alim, Marvin D., Mavila, Sudheendran, Miller, David B., Huang, Sijia, Podgórski, Maciej, Cox, Lewis M., Sullivan, Amy C., McLeod, Robert R., and Bowman, Christopher N. Realizing High Refractive Index Thiol-X Materials: A General and Scalable Synthetic Approach. Retrieved from https://par.nsf.gov/biblio/10197860. ACS Materials Letters 1.5 Web. doi:10.1021/acsmaterialslett.9b00331.

Alim, Marvin D., Mavila, Sudheendran, Miller, David B., Huang, Sijia, Podgórski, Maciej, Cox, Lewis M., Sullivan, Amy C., McLeod, Robert R., & Bowman, Christopher N. Realizing High Refractive Index Thiol-X Materials: A General and Scalable Synthetic Approach. ACS Materials Letters, 1 (5). Retrieved from https://par.nsf.gov/biblio/10197860. https://doi.org/10.1021/acsmaterialslett.9b00331

Alim, Marvin D., Mavila, Sudheendran, Miller, David B., Huang, Sijia, Podgórski, Maciej, Cox, Lewis M., Sullivan, Amy C., McLeod, Robert R., and Bowman, Christopher N. "Realizing High Refractive Index Thiol-X Materials: A General and Scalable Synthetic Approach". ACS Materials Letters 1 (5). Country unknown/Code not available. https://doi.org/10.1021/acsmaterialslett.9b00331. https://par.nsf.gov/biblio/10197860.

@article{osti_10197860,
place = {Country unknown/Code not available}, title = {Realizing High Refractive Index Thiol-X Materials: A General and Scalable Synthetic Approach}, url = {https://par.nsf.gov/biblio/10197860}, DOI = {10.1021/acsmaterialslett.9b00331}, abstractNote = {}, journal = {ACS Materials Letters}, volume = {1}, number = {5}, author = {Alim, Marvin D. and Mavila, Sudheendran and Miller, David B. and Huang, Sijia and Podgórski, Maciej and Cox, Lewis M. and Sullivan, Amy C. and McLeod, Robert R. and Bowman, Christopher N.}, }