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Title: Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films
Authors:
; ; ; ;
Award ID(s):
1710214
Publication Date:
NSF-PAR ID:
10201101
Journal Name:
Microscopy and Microanalysis
Volume:
25
Issue:
S2
Page Range or eLocation-ID:
2088 to 2089
ISSN:
1431-9276
Sponsoring Org:
National Science Foundation
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