Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films
- Award ID(s):
- 1710214
- NSF-PAR ID:
- 10201101
- Date Published:
- Journal Name:
- Microscopy and Microanalysis
- Volume:
- 25
- Issue:
- S2
- ISSN:
- 1431-9276
- Page Range / eLocation ID:
- 2088 to 2089
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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