Xu, Bowen, Saygin, Verda, Brown, Keith A., and Andersson, Sean B. High-resolution measurement of atomic force microscope cantilever resonance frequency. Review of Scientific Instruments 91.12 Web. doi:10.1063/5.0026069.

Xu, Bowen, Saygin, Verda, Brown, Keith A., & Andersson, Sean B. High-resolution measurement of atomic force microscope cantilever resonance frequency. Review of Scientific Instruments, 91 (12). https://doi.org/10.1063/5.0026069

Xu, Bowen, Saygin, Verda, Brown, Keith A., and Andersson, Sean B. "High-resolution measurement of atomic force microscope cantilever resonance frequency". Review of Scientific Instruments 91 (12). Country unknown/Code not available: American Institute of Physics. https://doi.org/10.1063/5.0026069. https://par.nsf.gov/biblio/10207802.

@article{osti_10207802,
place = {Country unknown/Code not available}, title = {High-resolution measurement of atomic force microscope cantilever resonance frequency}, url = {https://par.nsf.gov/biblio/10207802}, DOI = {10.1063/5.0026069}, abstractNote = {Not Available}, journal = {Review of Scientific Instruments}, volume = {91}, number = {12}, publisher = {American Institute of Physics}, author = {Xu, Bowen and Saygin, Verda and Brown, Keith A. and Andersson, Sean B.}, }