Kotsonis, George N., Meisenheimer, Peter B., Miao, Leixin, Roth, Joseph, Wang, Baomin, Shafer, Padraic, Engel-Herbert, Roman, Alem, Nasim, Heron, John T., Rost, Christina M., and Maria, Jon-Paul. Property and cation valence engineering in entropy-stabilized oxide thin films. Retrieved from https://par.nsf.gov/biblio/10211685. Physical Review Materials 4.10 Web. doi:10.1103/PhysRevMaterials.4.100401.

Kotsonis, George N., Meisenheimer, Peter B., Miao, Leixin, Roth, Joseph, Wang, Baomin, Shafer, Padraic, Engel-Herbert, Roman, Alem, Nasim, Heron, John T., Rost, Christina M., & Maria, Jon-Paul. Property and cation valence engineering in entropy-stabilized oxide thin films. Physical Review Materials, 4 (10). Retrieved from https://par.nsf.gov/biblio/10211685. https://doi.org/10.1103/PhysRevMaterials.4.100401

Kotsonis, George N., Meisenheimer, Peter B., Miao, Leixin, Roth, Joseph, Wang, Baomin, Shafer, Padraic, Engel-Herbert, Roman, Alem, Nasim, Heron, John T., Rost, Christina M., and Maria, Jon-Paul. "Property and cation valence engineering in entropy-stabilized oxide thin films". Physical Review Materials 4 (10). Country unknown/Code not available. https://doi.org/10.1103/PhysRevMaterials.4.100401. https://par.nsf.gov/biblio/10211685.

@article{osti_10211685,
place = {Country unknown/Code not available}, title = {Property and cation valence engineering in entropy-stabilized oxide thin films}, url = {https://par.nsf.gov/biblio/10211685}, DOI = {10.1103/PhysRevMaterials.4.100401}, abstractNote = {}, journal = {Physical Review Materials}, volume = {4}, number = {10}, author = {Kotsonis, George N. and Meisenheimer, Peter B. and Miao, Leixin and Roth, Joseph and Wang, Baomin and Shafer, Padraic and Engel-Herbert, Roman and Alem, Nasim and Heron, John T. and Rost, Christina M. and Maria, Jon-Paul}, editor = {null} }