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Title: A Cross-sectional Profile Based Model for Stripline Conductor Surface Roughness
Award ID(s):
1916535
NSF-PAR ID:
10212849
Author(s) / Creator(s):
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Date Published:
Journal Name:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
Page Range / eLocation ID:
334 to 339
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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