Izadi, Omid Hoseini, Shumiya, Hideki, Konno, Shota, Araki, Kenji, Pommerenke, David, and Kim, DongHyun. Analysis Of CPU Loading Effect On ESD Susceptibility. Retrieved from https://par.nsf.gov/biblio/10213102. 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) . Web. doi:10.1109/EMCSI38923.2020.9191545.

Izadi, Omid Hoseini, Shumiya, Hideki, Konno, Shota, Araki, Kenji, Pommerenke, David, & Kim, DongHyun. Analysis Of CPU Loading Effect On ESD Susceptibility. 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), (). Retrieved from https://par.nsf.gov/biblio/10213102. https://doi.org/10.1109/EMCSI38923.2020.9191545

Izadi, Omid Hoseini, Shumiya, Hideki, Konno, Shota, Araki, Kenji, Pommerenke, David, and Kim, DongHyun. "Analysis Of CPU Loading Effect On ESD Susceptibility". 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (). Country unknown/Code not available. https://doi.org/10.1109/EMCSI38923.2020.9191545. https://par.nsf.gov/biblio/10213102.

@article{osti_10213102,
place = {Country unknown/Code not available}, title = {Analysis Of CPU Loading Effect On ESD Susceptibility}, url = {https://par.nsf.gov/biblio/10213102}, DOI = {10.1109/EMCSI38923.2020.9191545}, abstractNote = {}, journal = {2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)}, author = {Izadi, Omid Hoseini and Shumiya, Hideki and Konno, Shota and Araki, Kenji and Pommerenke, David and Kim, DongHyun}, editor = {null} }