Cotton, Daniel E., Moon, Aaron P., and Roberts, Sean T. Using Electronic Sum-Frequency Generation to Analyze the Interfacial Structure of Singlet Fission-Capable Perylenediimide Thin Films. Retrieved from https://par.nsf.gov/biblio/10214041. The Journal of Physical Chemistry C 124.21 Web. doi:10.1021/acs.jpcc.0c01025.

Cotton, Daniel E., Moon, Aaron P., & Roberts, Sean T. Using Electronic Sum-Frequency Generation to Analyze the Interfacial Structure of Singlet Fission-Capable Perylenediimide Thin Films. The Journal of Physical Chemistry C, 124 (21). Retrieved from https://par.nsf.gov/biblio/10214041. https://doi.org/10.1021/acs.jpcc.0c01025

Cotton, Daniel E., Moon, Aaron P., and Roberts, Sean T. "Using Electronic Sum-Frequency Generation to Analyze the Interfacial Structure of Singlet Fission-Capable Perylenediimide Thin Films". The Journal of Physical Chemistry C 124 (21). Country unknown/Code not available. https://doi.org/10.1021/acs.jpcc.0c01025. https://par.nsf.gov/biblio/10214041.

@article{osti_10214041,
place = {Country unknown/Code not available}, title = {Using Electronic Sum-Frequency Generation to Analyze the Interfacial Structure of Singlet Fission-Capable Perylenediimide Thin Films}, url = {https://par.nsf.gov/biblio/10214041}, DOI = {10.1021/acs.jpcc.0c01025}, abstractNote = {}, journal = {The Journal of Physical Chemistry C}, volume = {124}, number = {21}, author = {Cotton, Daniel E. and Moon, Aaron P. and Roberts, Sean T.}, editor = {null} }