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Title: Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons
Award ID(s):
1757777
NSF-PAR ID:
10214772
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Nuclear Science
Volume:
68
Issue:
5
ISSN:
0018-9499
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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