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Title: Operando Particle-Scale Characterization of Silicon Anode Degradation during Cycling by Ultrahigh-Resolution X-ray Microscopy and Computed Tomography
Authors:
; ; ; ;
Award ID(s):
1751605
Publication Date:
NSF-PAR ID:
10219798
Journal Name:
ACS Applied Energy Materials
Volume:
4
Issue:
2
Page Range or eLocation-ID:
1657 to 1665
ISSN:
2574-0962
Sponsoring Org:
National Science Foundation
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