Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry
- Award ID(s):
- 1847964
- Publication Date:
- NSF-PAR ID:
- 10221250
- Journal Name:
- Microscopy and Microanalysis
- Volume:
- 26
- Issue:
- S2
- Page Range or eLocation-ID:
- 960 to 962
- ISSN:
- 1431-9276
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Publisher's Version of Record
- https://doi.org/10.1017/S1431927620016499
