Li, Yue, Kim, Ilmun, and Wei, Yuting. Randomized tests for high-dimensional regression: A more efficient and powerful solution. Retrieved from https://par.nsf.gov/biblio/10222368. Advances in neural information processing systems .
Li, Yue, Kim, Ilmun, & Wei, Yuting. Randomized tests for high-dimensional regression: A more efficient and powerful solution. Advances in neural information processing systems, (). Retrieved from https://par.nsf.gov/biblio/10222368.
Li, Yue, Kim, Ilmun, and Wei, Yuting.
"Randomized tests for high-dimensional regression: A more efficient and powerful solution". Advances in neural information processing systems (). Country unknown/Code not available. https://par.nsf.gov/biblio/10222368.
@article{osti_10222368,
place = {Country unknown/Code not available},
title = {Randomized tests for high-dimensional regression: A more efficient and powerful solution},
url = {https://par.nsf.gov/biblio/10222368},
abstractNote = {},
journal = {Advances in neural information processing systems},
author = {Li, Yue and Kim, Ilmun and Wei, Yuting},
editor = {null}
}
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