Koenig, Thomas R., Rao, Zhaoxia, Chason, Eric, Tucker, Garritt J., and Thompson, Gregory B. The microstructural and stress evolution in sputter deposited Ni thin films. Retrieved from https://par.nsf.gov/biblio/10222407. Surface and Coatings Technology 412.C Web. doi:10.1016/j.surfcoat.2021.126973.

Koenig, Thomas R., Rao, Zhaoxia, Chason, Eric, Tucker, Garritt J., & Thompson, Gregory B. The microstructural and stress evolution in sputter deposited Ni thin films. Surface and Coatings Technology, 412 (C). Retrieved from https://par.nsf.gov/biblio/10222407. https://doi.org/10.1016/j.surfcoat.2021.126973

Koenig, Thomas R., Rao, Zhaoxia, Chason, Eric, Tucker, Garritt J., and Thompson, Gregory B. "The microstructural and stress evolution in sputter deposited Ni thin films". Surface and Coatings Technology 412 (C). Country unknown/Code not available. https://doi.org/10.1016/j.surfcoat.2021.126973. https://par.nsf.gov/biblio/10222407.

@article{osti_10222407,
place = {Country unknown/Code not available}, title = {The microstructural and stress evolution in sputter deposited Ni thin films}, url = {https://par.nsf.gov/biblio/10222407}, DOI = {10.1016/j.surfcoat.2021.126973}, abstractNote = {}, journal = {Surface and Coatings Technology}, volume = {412}, number = {C}, author = {Koenig, Thomas R. and Rao, Zhaoxia and Chason, Eric and Tucker, Garritt J. and Thompson, Gregory B.}, editor = {null} }