Li, Yuan, Root, Samuel E., Belding, Lee, Park, Junwoo, Rawson, Jeff, Yoon, Hyo Jae, Baghbanzadeh, Mostafa, Rothemund, Philipp, and Whitesides, George M. Characterizing Chelation at Surfaces by Charge Tunneling. Retrieved from https://par.nsf.gov/biblio/10227740. Journal of the American Chemical Society 143.15 Web. doi:10.1021/jacs.1c01800.

Li, Yuan, Root, Samuel E., Belding, Lee, Park, Junwoo, Rawson, Jeff, Yoon, Hyo Jae, Baghbanzadeh, Mostafa, Rothemund, Philipp, & Whitesides, George M. Characterizing Chelation at Surfaces by Charge Tunneling. Journal of the American Chemical Society, 143 (15). Retrieved from https://par.nsf.gov/biblio/10227740. https://doi.org/10.1021/jacs.1c01800

Li, Yuan, Root, Samuel E., Belding, Lee, Park, Junwoo, Rawson, Jeff, Yoon, Hyo Jae, Baghbanzadeh, Mostafa, Rothemund, Philipp, and Whitesides, George M. "Characterizing Chelation at Surfaces by Charge Tunneling". Journal of the American Chemical Society 143 (15). Country unknown/Code not available. https://doi.org/10.1021/jacs.1c01800. https://par.nsf.gov/biblio/10227740.

@article{osti_10227740,
place = {Country unknown/Code not available}, title = {Characterizing Chelation at Surfaces by Charge Tunneling}, url = {https://par.nsf.gov/biblio/10227740}, DOI = {10.1021/jacs.1c01800}, abstractNote = {}, journal = {Journal of the American Chemical Society}, volume = {143}, number = {15}, author = {Li, Yuan and Root, Samuel E. and Belding, Lee and Park, Junwoo and Rawson, Jeff and Yoon, Hyo Jae and Baghbanzadeh, Mostafa and Rothemund, Philipp and Whitesides, George M.}, editor = {null} }