Li, Guodong, An, Qi, Duan, Bo, Borgsmiller, Leah, Malki, Muath Al, Agne, Matthias, Aydemir, Umut, Zhai, Pengcheng, Zhang, Qingjie, Morozov, Sergey I., Goddard, William A., and Snyder, G. Jeffrey. Fracture toughness of thermoelectric materials. Retrieved from https://par.nsf.gov/biblio/10248753. Materials Science and Engineering: R: Reports 144.C Web. doi:10.1016/j.mser.2021.100607.

Li, Guodong, An, Qi, Duan, Bo, Borgsmiller, Leah, Malki, Muath Al, Agne, Matthias, Aydemir, Umut, Zhai, Pengcheng, Zhang, Qingjie, Morozov, Sergey I., Goddard, William A., & Snyder, G. Jeffrey. Fracture toughness of thermoelectric materials. Materials Science and Engineering: R: Reports, 144 (C). Retrieved from https://par.nsf.gov/biblio/10248753. https://doi.org/10.1016/j.mser.2021.100607

Li, Guodong, An, Qi, Duan, Bo, Borgsmiller, Leah, Malki, Muath Al, Agne, Matthias, Aydemir, Umut, Zhai, Pengcheng, Zhang, Qingjie, Morozov, Sergey I., Goddard, William A., and Snyder, G. Jeffrey. "Fracture toughness of thermoelectric materials". Materials Science and Engineering: R: Reports 144 (C). Country unknown/Code not available. https://doi.org/10.1016/j.mser.2021.100607. https://par.nsf.gov/biblio/10248753.

@article{osti_10248753,
place = {Country unknown/Code not available}, title = {Fracture toughness of thermoelectric materials}, url = {https://par.nsf.gov/biblio/10248753}, DOI = {10.1016/j.mser.2021.100607}, abstractNote = {}, journal = {Materials Science and Engineering: R: Reports}, volume = {144}, number = {C}, author = {Li, Guodong and An, Qi and Duan, Bo and Borgsmiller, Leah and Malki, Muath Al and Agne, Matthias and Aydemir, Umut and Zhai, Pengcheng and Zhang, Qingjie and Morozov, Sergey I. and Goddard, William A. and Snyder, G. Jeffrey}, editor = {null} }