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- Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths
Title:
Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths
- NSF-PAR ID:
- 10250010
- Author(s) / Creator(s):
- Lv, P.; Cao, G. F.; Wen, L. J.; Kharusi, S. Al; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Breur, P. A.; Brodsky, J. P.; Brown, E.; Brunner, T.; Mamahit, S. Byrne; Caden, E.; Cao, L.; Chambers, C.; Chana, B.more » ; Charlebois, S. A.; Chiu, M.; Cleveland, B.; Coon, M.; Craycraft, A.; Dalmasson, J.; Daniels, T.; Darroch, L.; St. Croix, A. De; Mesrobian-Kabakian, A. Der; Deslandes, K.; DeVoe, R.; Vacri, M. L.; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Doria, L.; Dragone, A.; Echevers, J.; Edaltafar, F.; Elbeltagi, M.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Ferrara, S.; Feyzbakhsh, S.; Fucarino, A.; Gallina, G.; Gautam, P.; Giacomini, G.; Goeldi, D.; Gornea, R.; Gratta, G.; Hansen, E. V.; Heffner, M.; Hoppe, E. W.; Hobl, J.; House, A.; Hughes, M.; Iverson, A.; Jamil, A.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Koffas, T.; Krucken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leach, K. G.; Lenardo, B. G.; Leonard, D. S.; Li, G.; Li, S.; Li, Z.; Licciardi, C.; MacLellan, R.; Massacret, N.; McElroy, T.; Medina-Peregrina, M.; Michel, T.; Mong, B.; Moore, D. C.; Murray, K.; Nakarmi, P.; Natzke, C. R.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Ostrovskiy, I.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J. -F.; Radeka, V.; Raguzin, E.; Rescia, S.; Retiere, F.; Richman, M.; Robinson, A.; Rossignol, T.; Rowson, P. C.; Roy, N.; Runge, J.; Saldanha, R.; Sangiorgio, S.; Skarpaas, K.; Soma, A. K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X. L.; Tarka, M.; Todd, J.; Totev, T. I.; Tsang, R.; Tsang, T.; Vachon, F.; Veeraraghavan, V.; Viel, S.; Visser, G.; Vivo-Vilches, C.; Vuilleumier, J.-L.; Wagenpfeil, M.; Wager, T.; Walent, M.; Wang, Q.; Watkins, J.; Wei, W.; Wichoski, U.; Wu, S. X.; Wu, W. H.; Wu, X.; Xia, Q.; Yang, H.; Yang, L.; Zeldovich, O.; Zhao, J.; Zhou, Y.; Ziegler, T. « less
- Date Published:
- Journal Name:
- IEEE Transactions on Nuclear Science
- Volume:
- 67
- Issue:
- 12
- ISSN:
- 0018-9499
- Page Range / eLocation ID:
- 2501 to 2510
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1109/TNS.2020.3035172
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!- Citation Formats
- MLA
Cite: MLA FormatLv, P., Cao, G. F., Wen, L. J., Kharusi, S. Al, Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., St. Croix, A. De, Mesrobian-Kabakian, A. Der, Deslandes, K., DeVoe, R., Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hobl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krucken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Nakarmi, P., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Retiere, F., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Watkins, J., Wei, W., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths. Retrieved from https://par.nsf.gov/biblio/10250010. IEEE Transactions on Nuclear Science 67.12 Web. doi:10.1109/TNS.2020.3035172.
- APA
Cite: APA FormatLv, P., Cao, G. F., Wen, L. J., Kharusi, S. Al, Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., St. Croix, A. De, Mesrobian-Kabakian, A. Der, Deslandes, K., DeVoe, R., Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hobl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krucken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Nakarmi, P., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Retiere, F., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Watkins, J., Wei, W., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., & Ziegler, T. Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths. IEEE Transactions on Nuclear Science, 67 (12). Retrieved from https://par.nsf.gov/biblio/10250010. https://doi.org/10.1109/TNS.2020.3035172
- Chicago
Cite: Chicago FormatLv, P., Cao, G. F., Wen, L. J., Kharusi, S. Al, Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Breur, P. A., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, L., Chambers, C., Chana, B., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., St. Croix, A. De, Mesrobian-Kabakian, A. Der, Deslandes, K., DeVoe, R., Vacri, M. L., Dilling, J., Ding, Y. Y., Dolinski, M. J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hobl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Krucken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leach, K. G., Lenardo, B. G., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D. C., Murray, K., Nakarmi, P., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rescia, S., Retiere, F., Richman, M., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Watkins, J., Wei, W., Wichoski, U., Wu, S. X., Wu, W. H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. "Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths". IEEE Transactions on Nuclear Science 67 (12). Country unknown/Code not available. https://doi.org/10.1109/TNS.2020.3035172. https://par.nsf.gov/biblio/10250010.
- BibTeX
Cite: BibTeX Format@article{osti_10250010,
place = {Country unknown/Code not available}, title = {Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths}, url = {https://par.nsf.gov/biblio/10250010}, DOI = {10.1109/TNS.2020.3035172}, abstractNote = {}, journal = {IEEE Transactions on Nuclear Science}, volume = {67}, number = {12}, author = {Lv, P. and Cao, G. F. and Wen, L. J. and Kharusi, S. Al and Anton, G. and Arnquist, I. J. and Badhrees, I. and Barbeau, P. S. and Beck, D. and Belov, V. and Bhatta, T. and Breur, P. A. and Brodsky, J. P. and Brown, E. and Brunner, T. and Mamahit, S. Byrne and Caden, E. and Cao, L. and Chambers, C. and Chana, B. and Charlebois, S. A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Dalmasson, J. and Daniels, T. and Darroch, L. and St. Croix, A. De and Mesrobian-Kabakian, A. Der and Deslandes, K. and DeVoe, R. and Vacri, M. L. and Dilling, J. and Ding, Y. Y. and Dolinski, M. J. and Doria, L. and Dragone, A. and Echevers, J. and Edaltafar, F. and Elbeltagi, M. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Ferrara, S. and Feyzbakhsh, S. and Fucarino, A. and Gallina, G. and Gautam, P. and Giacomini, G. and Goeldi, D. and Gornea, R. and Gratta, G. and Hansen, E. V. and Heffner, M. and Hoppe, E. W. and Hobl, J. and House, A. and Hughes, M. and Iverson, A. and Jamil, A. and Jewell, M. J. and Jiang, X. S. and Karelin, A. and Kaufman, L. J. and Koffas, T. and Krucken, R. and Kuchenkov, A. and Kumar, K. S. and Lan, Y. and Larson, A. and Leach, K. G. and Lenardo, B. G. and Leonard, D. S. and Li, G. and Li, S. and Li, Z. and Licciardi, C. and MacLellan, R. and Massacret, N. and McElroy, T. and Medina-Peregrina, M. and Michel, T. and Mong, B. and Moore, D. C. and Murray, K. and Nakarmi, P. and Natzke, C. R. and Newby, R. J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Odian, A. and Oriunno, M. and Orrell, J. L. and Ortega, G. S. and Ostrovskiy, I. and Overman, C. T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J. -F. and Radeka, V. and Raguzin, E. and Rescia, S. and Retiere, F. and Richman, M. and Robinson, A. and Rossignol, T. and Rowson, P. C. and Roy, N. and Runge, J. and Saldanha, R. and Sangiorgio, S. and Skarpaas, K. and Soma, A. K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X. L. and Tarka, M. and Todd, J. and Totev, T. I. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Viel, S. and Visser, G. and Vivo-Vilches, C. and Vuilleumier, J.-L. and Wagenpfeil, M. and Wager, T. and Walent, M. and Wang, Q. and Watkins, J. and Wei, W. and Wichoski, U. and Wu, S. X. and Wu, W. H. and Wu, X. and Xia, Q. and Yang, H. and Yang, L. and Zeldovich, O. and Zhao, J. and Zhou, Y. and Ziegler, T.}, editor = {null} }
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