Singh, Nikhilendra, Horwath, James, Arthur, Timothy, Alsem, Daan Hein, and Stach, Eric. Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-state Energy Storage Devices. Retrieved from https://par.nsf.gov/biblio/10279691. Microscopy and Microanalysis 26.S2 Web. doi:10.1017/S1431927620018206.

Singh, Nikhilendra, Horwath, James, Arthur, Timothy, Alsem, Daan Hein, & Stach, Eric. Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-state Energy Storage Devices. Microscopy and Microanalysis, 26 (S2). Retrieved from https://par.nsf.gov/biblio/10279691. https://doi.org/10.1017/S1431927620018206

Singh, Nikhilendra, Horwath, James, Arthur, Timothy, Alsem, Daan Hein, and Stach, Eric. "Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-state Energy Storage Devices". Microscopy and Microanalysis 26 (S2). Country unknown/Code not available. https://doi.org/10.1017/S1431927620018206. https://par.nsf.gov/biblio/10279691.

@article{osti_10279691,
place = {Country unknown/Code not available}, title = {Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-state Energy Storage Devices}, url = {https://par.nsf.gov/biblio/10279691}, DOI = {10.1017/S1431927620018206}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {26}, number = {S2}, author = {Singh, Nikhilendra and Horwath, James and Arthur, Timothy and Alsem, Daan Hein and Stach, Eric}, editor = {null} }