Singh, Nikhilendra, Horwath, James, Foucher, Alexandre, Arthur, Timothy S., Rodríguez Manzo, Julio A., Alsem, Daan Hein, and Stach, Eric. Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder. Retrieved from https://par.nsf.gov/biblio/10279697. Microscopy and Microanalysis 25.S2 Web. doi:10.1017/S1431927619011279.

Singh, Nikhilendra, Horwath, James, Foucher, Alexandre, Arthur, Timothy S., Rodríguez Manzo, Julio A., Alsem, Daan Hein, & Stach, Eric. Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder. Microscopy and Microanalysis, 25 (S2). Retrieved from https://par.nsf.gov/biblio/10279697. https://doi.org/10.1017/S1431927619011279

Singh, Nikhilendra, Horwath, James, Foucher, Alexandre, Arthur, Timothy S., Rodríguez Manzo, Julio A., Alsem, Daan Hein, and Stach, Eric. "Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder". Microscopy and Microanalysis 25 (S2). Country unknown/Code not available. https://doi.org/10.1017/S1431927619011279. https://par.nsf.gov/biblio/10279697.

@article{osti_10279697,
place = {Country unknown/Code not available}, title = {Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder}, url = {https://par.nsf.gov/biblio/10279697}, DOI = {10.1017/S1431927619011279}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {25}, number = {S2}, author = {Singh, Nikhilendra and Horwath, James and Foucher, Alexandre and Arthur, Timothy S. and Rodríguez Manzo, Julio A. and Alsem, Daan Hein and Stach, Eric}, editor = {null} }