Bandyopadhyay, R., Gustafson, S. E., Kapoor, K., Naragani, D., Pagan, D. C., and Sangid, M. D. Comparative assessment of backstress models using high-energy X-ray diffraction microscopy experiments and crystal plasticity finite element simulations. Retrieved from https://par.nsf.gov/biblio/10279705. International journal of plasticity 136. Web. doi:https://doi.org/10.1016/j.ijplas.2020.102887.

Bandyopadhyay, R., Gustafson, S. E., Kapoor, K., Naragani, D., Pagan, D. C., & Sangid, M. D. Comparative assessment of backstress models using high-energy X-ray diffraction microscopy experiments and crystal plasticity finite element simulations. International journal of plasticity, 136 (). Retrieved from https://par.nsf.gov/biblio/10279705. https://doi.org/https://doi.org/10.1016/j.ijplas.2020.102887

Bandyopadhyay, R., Gustafson, S. E., Kapoor, K., Naragani, D., Pagan, D. C., and Sangid, M. D. "Comparative assessment of backstress models using high-energy X-ray diffraction microscopy experiments and crystal plasticity finite element simulations". International journal of plasticity 136 (). Country unknown/Code not available. https://doi.org/https://doi.org/10.1016/j.ijplas.2020.102887. https://par.nsf.gov/biblio/10279705.

@article{osti_10279705,
place = {Country unknown/Code not available}, title = {Comparative assessment of backstress models using high-energy X-ray diffraction microscopy experiments and crystal plasticity finite element simulations}, url = {https://par.nsf.gov/biblio/10279705}, DOI = {https://doi.org/10.1016/j.ijplas.2020.102887}, abstractNote = {}, journal = {International journal of plasticity}, volume = {136}, author = {Bandyopadhyay, R. and Gustafson, S. E. and Kapoor, K. and Naragani, D. and Pagan, D. C. and Sangid, M. D.}, editor = {null} }