Benmore, C J, González, G B, Alderman, O L, Wilke, S K, Yarger, J L, Leinenweber, K, and Weber, J K. Hard x-ray methods for studying the structure of amorphous thin films and bulk glassy oxides. Retrieved from https://par.nsf.gov/biblio/10281302. Journal of Physics: Condensed Matter 33.19 Web. doi:10.1088/1361-648X/abe352.

Benmore, C J, González, G B, Alderman, O L, Wilke, S K, Yarger, J L, Leinenweber, K, & Weber, J K. Hard x-ray methods for studying the structure of amorphous thin films and bulk glassy oxides. Journal of Physics: Condensed Matter, 33 (19). Retrieved from https://par.nsf.gov/biblio/10281302. https://doi.org/10.1088/1361-648X/abe352

Benmore, C J, González, G B, Alderman, O L, Wilke, S K, Yarger, J L, Leinenweber, K, and Weber, J K. "Hard x-ray methods for studying the structure of amorphous thin films and bulk glassy oxides". Journal of Physics: Condensed Matter 33 (19). Country unknown/Code not available. https://doi.org/10.1088/1361-648X/abe352. https://par.nsf.gov/biblio/10281302.

@article{osti_10281302,
place = {Country unknown/Code not available}, title = {Hard x-ray methods for studying the structure of amorphous thin films and bulk glassy oxides}, url = {https://par.nsf.gov/biblio/10281302}, DOI = {10.1088/1361-648X/abe352}, abstractNote = {}, journal = {Journal of Physics: Condensed Matter}, volume = {33}, number = {19}, author = {Benmore, C J and González, G B and Alderman, O L and Wilke, S K and Yarger, J L and Leinenweber, K and Weber, J K}, }