Huang, RuiRui, Zhang, Qian, Zhang, Xuan, Li, JianGuo, Cao, TangQing, Yao, JiaHao, Xue, YunFei, Gao, HuaJian, and Li, XiaoYan. Dynamic recrystallization-induced temperature insensitivity of yield stress in single-crystal Al1.2CrFeCoNi micropillars. Retrieved from https://par.nsf.gov/biblio/10282390. Science China Technological Sciences 64.1 Web. doi:10.1007/s11431-020-1660-8.

Huang, RuiRui, Zhang, Qian, Zhang, Xuan, Li, JianGuo, Cao, TangQing, Yao, JiaHao, Xue, YunFei, Gao, HuaJian, & Li, XiaoYan. Dynamic recrystallization-induced temperature insensitivity of yield stress in single-crystal Al1.2CrFeCoNi micropillars. Science China Technological Sciences, 64 (1). Retrieved from https://par.nsf.gov/biblio/10282390. https://doi.org/10.1007/s11431-020-1660-8

Huang, RuiRui, Zhang, Qian, Zhang, Xuan, Li, JianGuo, Cao, TangQing, Yao, JiaHao, Xue, YunFei, Gao, HuaJian, and Li, XiaoYan. "Dynamic recrystallization-induced temperature insensitivity of yield stress in single-crystal Al1.2CrFeCoNi micropillars". Science China Technological Sciences 64 (1). Country unknown/Code not available. https://doi.org/10.1007/s11431-020-1660-8. https://par.nsf.gov/biblio/10282390.

@article{osti_10282390,
place = {Country unknown/Code not available}, title = {Dynamic recrystallization-induced temperature insensitivity of yield stress in single-crystal Al1.2CrFeCoNi micropillars}, url = {https://par.nsf.gov/biblio/10282390}, DOI = {10.1007/s11431-020-1660-8}, abstractNote = {}, journal = {Science China Technological Sciences}, volume = {64}, number = {1}, author = {Huang, RuiRui and Zhang, Qian and Zhang, Xuan and Li, JianGuo and Cao, TangQing and Yao, JiaHao and Xue, YunFei and Gao, HuaJian and Li, XiaoYan}, editor = {null} }