Zhang, W.-D., Growden, T. A., Storm, D. F., Meyer, D. J., Berger, P. R., and Brown, E. R. Investigation of Switching Time in GaN/AlN Resonant Tunneling Diodes by Experiments and P-SPICE Models. Retrieved from https://par.nsf.gov/biblio/10283478. IEEE Transactions on Electron Devices 67.1 Web. doi:10.1109/TED.2019.2955360.

Zhang, W.-D., Growden, T. A., Storm, D. F., Meyer, D. J., Berger, P. R., & Brown, E. R. Investigation of Switching Time in GaN/AlN Resonant Tunneling Diodes by Experiments and P-SPICE Models. IEEE Transactions on Electron Devices, 67 (1). Retrieved from https://par.nsf.gov/biblio/10283478. https://doi.org/10.1109/TED.2019.2955360

Zhang, W.-D., Growden, T. A., Storm, D. F., Meyer, D. J., Berger, P. R., and Brown, E. R. "Investigation of Switching Time in GaN/AlN Resonant Tunneling Diodes by Experiments and P-SPICE Models". IEEE Transactions on Electron Devices 67 (1). Country unknown/Code not available. https://doi.org/10.1109/TED.2019.2955360. https://par.nsf.gov/biblio/10283478.

@article{osti_10283478,
place = {Country unknown/Code not available}, title = {Investigation of Switching Time in GaN/AlN Resonant Tunneling Diodes by Experiments and P-SPICE Models}, url = {https://par.nsf.gov/biblio/10283478}, DOI = {10.1109/TED.2019.2955360}, abstractNote = {}, journal = {IEEE Transactions on Electron Devices}, volume = {67}, number = {1}, author = {Zhang, W.-D. and Growden, T. A. and Storm, D. F. and Meyer, D. J. and Berger, P. R. and Brown, E. R.}, editor = {null} }