Chen, Chia-Hsun, Sher, Pin-Hao, Chen, Cheng-Pin, Choi, Wing-Kit, Bardeen, Christopher J., Chiu, Tien-Lung, Wang, Juen-Kai, and Lee, Jiun-Haw. Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films. Retrieved from https://par.nsf.gov/biblio/10289348. The Journal of Physical Chemistry C 124.47 Web. doi:10.1021/acs.jpcc.0c07887.

Chen, Chia-Hsun, Sher, Pin-Hao, Chen, Cheng-Pin, Choi, Wing-Kit, Bardeen, Christopher J., Chiu, Tien-Lung, Wang, Juen-Kai, & Lee, Jiun-Haw. Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films. The Journal of Physical Chemistry C, 124 (47). Retrieved from https://par.nsf.gov/biblio/10289348. https://doi.org/10.1021/acs.jpcc.0c07887

Chen, Chia-Hsun, Sher, Pin-Hao, Chen, Cheng-Pin, Choi, Wing-Kit, Bardeen, Christopher J., Chiu, Tien-Lung, Wang, Juen-Kai, and Lee, Jiun-Haw. "Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films". The Journal of Physical Chemistry C 124 (47). Country unknown/Code not available. https://doi.org/10.1021/acs.jpcc.0c07887. https://par.nsf.gov/biblio/10289348.

@article{osti_10289348,
place = {Country unknown/Code not available}, title = {Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films}, url = {https://par.nsf.gov/biblio/10289348}, DOI = {10.1021/acs.jpcc.0c07887}, abstractNote = {}, journal = {The Journal of Physical Chemistry C}, volume = {124}, number = {47}, author = {Chen, Chia-Hsun and Sher, Pin-Hao and Chen, Cheng-Pin and Choi, Wing-Kit and Bardeen, Christopher J. and Chiu, Tien-Lung and Wang, Juen-Kai and Lee, Jiun-Haw}, editor = {null} }