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  • Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
Title: Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.  more » « less
Award ID(s):
2003847
PAR ID:
10290666
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
Chemical Communications
Volume:
56
Issue:
30
ISSN:
1359-7345
Page Range / eLocation ID:
4204 to 4207
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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