Ayoola, Henry O., Li, Cheng-Han, House, Stephen D., Bonifacio, Cecile S., Kisslinger, Kim, Jinschek, Joerg, Saidi, Wissam A., and Yang, Judith C. Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS. Retrieved from https://par.nsf.gov/biblio/10294842. Ultramicroscopy 219.C Web. doi:10.1016/j.ultramic.2020.113127.

Ayoola, Henry O., Li, Cheng-Han, House, Stephen D., Bonifacio, Cecile S., Kisslinger, Kim, Jinschek, Joerg, Saidi, Wissam A., & Yang, Judith C. Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS. Ultramicroscopy, 219 (C). Retrieved from https://par.nsf.gov/biblio/10294842. https://doi.org/10.1016/j.ultramic.2020.113127

Ayoola, Henry O., Li, Cheng-Han, House, Stephen D., Bonifacio, Cecile S., Kisslinger, Kim, Jinschek, Joerg, Saidi, Wissam A., and Yang, Judith C. "Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS". Ultramicroscopy 219 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2020.113127. https://par.nsf.gov/biblio/10294842.

@article{osti_10294842,
place = {Country unknown/Code not available}, title = {Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS}, url = {https://par.nsf.gov/biblio/10294842}, DOI = {10.1016/j.ultramic.2020.113127}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {219}, number = {C}, author = {Ayoola, Henry O. and Li, Cheng-Han and House, Stephen D. and Bonifacio, Cecile S. and Kisslinger, Kim and Jinschek, Joerg and Saidi, Wissam A. and Yang, Judith C.}, editor = {null} }