Verma, Vishash, Dahal, Drona, Radha Krishnan, Raj Kishen, Lussem, Bjorn, and Tsai, Tsung-Heng. A new approach to transfer characteristic slope estimation. Retrieved from https://par.nsf.gov/biblio/10296558. Proc. SPIE; Organic and Hybrid Field-Effect Transistors XX 11811. Web. doi:10.1117/12.2593301.

Verma, Vishash, Dahal, Drona, Radha Krishnan, Raj Kishen, Lussem, Bjorn, & Tsai, Tsung-Heng. A new approach to transfer characteristic slope estimation. Proc. SPIE; Organic and Hybrid Field-Effect Transistors XX, 11811 (). Retrieved from https://par.nsf.gov/biblio/10296558. https://doi.org/10.1117/12.2593301

Verma, Vishash, Dahal, Drona, Radha Krishnan, Raj Kishen, Lussem, Bjorn, and Tsai, Tsung-Heng. "A new approach to transfer characteristic slope estimation". Proc. SPIE; Organic and Hybrid Field-Effect Transistors XX 11811 (). Country unknown/Code not available. https://doi.org/10.1117/12.2593301. https://par.nsf.gov/biblio/10296558.

@article{osti_10296558,
place = {Country unknown/Code not available}, title = {A new approach to transfer characteristic slope estimation}, url = {https://par.nsf.gov/biblio/10296558}, DOI = {10.1117/12.2593301}, abstractNote = {}, journal = {Proc. SPIE; Organic and Hybrid Field-Effect Transistors XX}, volume = {11811}, author = {Verma, Vishash and Dahal, Drona and Radha Krishnan, Raj Kishen and Lussem, Bjorn and Tsai, Tsung-Heng}, editor = {Jurchescu, Oana D. and McCulloch, Iain} }