Manzorro, Ramon, Xu, Yuchen, Vincent, Joshua, Rivera, Roberto, Matteson, David, and Crozier, Peter. Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames. Retrieved from https://par.nsf.gov/biblio/10298016. Microscopy and Microanalysis 27.S1 Web. doi:10.1017/S1431927621008011.

Manzorro, Ramon, Xu, Yuchen, Vincent, Joshua, Rivera, Roberto, Matteson, David, & Crozier, Peter. Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames. Microscopy and Microanalysis, 27 (S1). Retrieved from https://par.nsf.gov/biblio/10298016. https://doi.org/10.1017/S1431927621008011

Manzorro, Ramon, Xu, Yuchen, Vincent, Joshua, Rivera, Roberto, Matteson, David, and Crozier, Peter. "Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames". Microscopy and Microanalysis 27 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927621008011. https://par.nsf.gov/biblio/10298016.

@article{osti_10298016,
place = {Country unknown/Code not available}, title = {Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames}, url = {https://par.nsf.gov/biblio/10298016}, DOI = {10.1017/S1431927621008011}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {27}, number = {S1}, author = {Manzorro, Ramon and Xu, Yuchen and Vincent, Joshua and Rivera, Roberto and Matteson, David and Crozier, Peter}, editor = {null} }